Sudani, Siva K: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - High resolution ADC spectral test with known impure source and non-coherent sampling

Sudani, Siva, Degang Chen,, Geiger, Randall

Year:

2013

Language:

english

File:

PDF, 605 KB

english, 2013

2

[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Sinusoidal signal generation for production testing and BIST applications

Vasan, Bharath K, Sudani, Siva K, Chen, Degang J, Geiger, Randall L

Year:

2012

Language:

english

File:

PDF, 1.61 MB

english, 2012

3

[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit

Zhang, Xu, Cai, Chongli, Meng, Hao, Sudani, Siva, Geiger, Randall, Chen, Degang

Year:

2015

Language:

english

File:

PDF, 585 KB

english, 2015

4

Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique

Karthik Vasan, Bharath, Sudani, Siva Kumar, Chen, Degang J., Geiger, Randall L.

Journal:

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications

Year:

2013

Language:

english

File:

PDF, 2.64 MB

english, 2013

5

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping

Sudani, Siva, Xu, Li, Chen, Degang

Year:

2013

Language:

english

File:

PDF, 1.48 MB

english, 2013

6

[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - A 2-FFT method for on-chip spectral testing without requiring coherency

Sudani, Siva, Chen, Degang, Geiger, Randy

Year:

2011

Language:

english

File:

PDF, 1.88 MB

english, 2011

7

[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - A method for accurate full spectrum testing without requiring coherency

Sudani, Siva, Chen, Degang, Geiger, Randy

Year:

2012

Language:

english

File:

PDF, 366 KB

english, 2012

8

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - A novel robust and accurate spectral testing method for non-coherent sampling

Sudani, Siva, Wu, Minshun, Chen, Degang

Year:

2011

Language:

english

File:

PDF, 2.03 MB

english, 2011

9

FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency

Sudani, Siva Kumar, Chen, Degang

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2013

Language:

english

File:

PDF, 903 KB

english, 2013

10

Efficient Spectral Testing With Clipped and Noncoherently Sampled Data

Li Xu,, Sudani, Siva Kumar, Degang Chen,

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2014

Language:

english

File:

PDF, 1.54 MB

english, 2014

11

A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods

Sudani, Siva Kumar, Xu, Li, Chen, Degang

Journal:

IEEE Design and Test

Year:

2015

Language:

english

File:

PDF, 1.29 MB

english, 2015

12

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Low cost ultra-pure sine wave generation with self calibration

Zhuang, Yuming, Unnithan, Akhilesh Kesavan, Joseph, Arun, Sudani, Siva, Magstadt, Benjamin, Chen, Degang

Year:

2016

Language:

english

File:

PDF, 1.72 MB

english, 2016